TRANSLARITY WAFER TRANSLATOR

Image of the Translarity Wafer Translator

LOW COST, HIGH PERFORMANCE
FULL WAFER SEMICONDUCTOR TEST

A new solution is needed to reduce the cost of wafer test. TRANSLARITY has the technology to break the code and offer the lowest cost of test. Learn more.

Image of Translarity Wafer Translator with high density contacts and complex electronics

DRAM wafer test – requires high density contacts and complex electronics on a full wafer contactor. 

The Wafer TranslatorTM handles this. Learn more.

Translarity Wafer Translator image showing tight pitch Cu bump probing

SOC/Logic wafer test – requires tight pitch Cu bump probing with high density space transformation. The Wafer Translator TM includes this. Learn more.

Translarity Wafer Translator die image

NAND wafer test – requires low cost full wafer contactors.  The Wafer Translator TM provides this at a fraction of the cost. Learn more.

Translarity – Innovations in Probe Stacks